Evaluating the impact of cluster parameters on FPGA performance and density

FPGA evaluation

Authors

  • Neeti Deenbandhu Chhotu Ram University of Science and Technology
  • Sunita Dahiya Deenbandhu Chhotu Ram University of Science and Technology

Keywords:

Look-up table LUT, logic cluster, basic logic element BLE, CAD, field programmable gate array FPGA, cluster inputs

Abstract

There has been a lot of preliminary investigation on the cluster-based Field Programmable Gate Arrays (FPGAs) to determine the cluster parameters that result in an efficient architecture in terms of area or speed or both. However, the advancement of technology and Computer Aided Design (CAD) tools provides numerous reasons to further explore FPGA clusters for possible improvements. This work investigates the area and speed performance of FPGA logic block architectures comprising clusters based on look-up tables (LUTs). Two crucial parameters of the cluster-based FPGA architectures are considered for investigation: the size of LUT (K) and the total inputs provided to a cluster (I). The LUT size is varied from 4 to 7 and the cluster inputs are varied from 40% of the total cluster inputs to their maximum permissible value. Experimentally, using VTR tool flow, it is found that the best area-delay trade-off is obtained for 4-input LUT based cluster using 80% of the maximum cluster inputs. It has been observed that some clusters exhibit better trade-off between area and delay with 70-80% of the total cluster inputs.

URN:NBN:sciencein.jist.2023.v11.520

Author Biographies

Neeti, Deenbandhu Chhotu Ram University of Science and Technology

Department of Electronics and Communication Engineering

Sunita Dahiya, Deenbandhu Chhotu Ram University of Science and Technology

Department of Electronics and Communication Engineering

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Published

2023-01-20

How to Cite

Neeti, & Dahiya, S. (2023). Evaluating the impact of cluster parameters on FPGA performance and density. Journal of Integrated Science and Technology, 11(3), 520. Retrieved from https://pubs.thesciencein.org/journal/index.php/jist/article/view/a520

Issue

Section

Engineering

URN